Advanced Optimization Applications in Engineering

Afaq Ahmad

In the ever-evolving landscape of engineering, a pressing challenge looms large—the need to navigate the complexities of modern problems with precision and efficiency. As industries grapple with an array of intricate issues, from sustainable materials to resilient infrastructure, the demand for optimal solutions has never been more pronounced. Traditional approaches are often inadequate, prompting the search for advanced optimization techniques capable of unraveling the intricacies inherent in engineering systems. The problem at hand is clear: how can engineers, researchers, and practitioners harness cutting-edge methodologies to address the multifaceted challenges shaping our technological future? Advanced Optimization Applications in Engineering , is a definitive guide poised to revolutionize problem-solving in civil engineering. This book offers a comprehensive exploration of state-of-the-art optimization algorithms and their transformative applications. By delving into genetic algorithms, particle swarm optimization, neural networks, and other metaheuristic strategies, this collection provides a roadmap for automating design processes, reducing costs, and unlocking innovative solutions. The chapters not only introduce these advanced techniques but also showcase their practical implementation across diverse engineering domains, making this book an indispensable resource for those seeking to stay at the forefront of technological advancements.

  • Format: Paperback
  • ISBN: 9798369344576
  • Publication Date: May 2024
  • Availability: In Stock - Despatched Within 5-7 Working Days

Fundamentals of Design of Experiments for Automotive Engineering Volume I

Young J. Chiang

  • Format: Hardback
  • ISBN: 9781468606027
  • Publication Date: Nov 2023
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Applied Aspects of Modern Metrology

Oleh Velychko

  • Format: Hardback
  • ISBN: 9781803550480
  • Publication Date: May 2022
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Standards, Methods and Solutions of Metrology

Luigi Cocco

  • Format: Hardback
  • ISBN: 9781789844627
  • Publication Date: Oct 2019
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Strategic Applications of Measurement Technologies and Instrumentation

Soubantika Palchoudhury

  • Format: Hardback
  • ISBN: 9781522554066
  • Publication Date: Dec 2018
  • Availability: In Stock - Despatched Within 5 Working Days

A Guide to the Automation Body of Knowledge

Nicholas P. Sands

  • Format: Hardback
  • ISBN: 9781941546918
  • Publication Date: Nov 2018
  • Availability: In Stock - Despatched Within 5-7 Working Days

Scientometrics

Mari Jibu

  • Format: Hardback
  • ISBN: 9781789233063
  • Publication Date: Jul 2018
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Innovations in Measuring and Evaluating Scientific Information

J. John Jeyasekar

  • Format: Hardback
  • ISBN: 9781522534570
  • Publication Date: Mar 2018
  • Availability: In Stock - Despatched Within 5 Working Days

The Condensed Handbook of Measurement and Control

N.E. Battikha

  • Format: Hardback
  • ISBN: 9781945541384
  • Publication Date: Jan 2018
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Calibration Handbook of Measuring Instruments

Alessandro Brunelli

  • Format: Paperback
  • ISBN: 9781945541575
  • Publication Date: Nov 2017
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Measurement Uncertainty

Ronald H. Dieck

  • Format: Paperback
  • ISBN: 9781941546949
  • Publication Date: Feb 2017
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Advances in Measurement Systems

Harinirina Randrianarisoa

  • Format: Hardback
  • ISBN: 9781680943665
  • Publication Date: Nov 2016
  • Availability: In Stock - Despatched Within 5-7 Working Days

Instrumentation and Measurement in Electrical Engineering

Harinirina Randrianarisoa

  • Format: Hardback
  • ISBN: 9781680943948
  • Publication Date: Nov 2016
  • Availability: In Stock - Despatched Within 5-7 Working Days

Applied Measurement Systems

Harinirina Randrianarisoa

  • Format: Hardback
  • ISBN: 9781680943689
  • Publication Date: Nov 2016
  • Availability: In Stock - Despatched Within 5-7 Working Days

Measurement in Science and Civil Engineering

Nelson Boli?var

  • Format: Hardback
  • ISBN: 9781680943726
  • Publication Date: Nov 2016
  • Availability: In Stock - Despatched Within 5-7 Working Days

New Trends and Developments in Metrology

Luigi Cocco

  • Format: Hardback
  • ISBN: 9789535124771
  • Publication Date: Jul 2016
  • Availability: Temporarily out of stock: Usually despatched in 14-18 days

Quantitative Core Level Photoelectron Spectroscopy

Juan A Colón Santana

This book introduces the reader to the concepts and instrumentation that emerge in an experimental approach to the photoemission process. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. This book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.

  • Imprint: IOP Concise Physics
  • Format: Paperback
  • ISBN: 9781627053051
  • Publication Date: Jan 2016
  • Availability: In Stock - Despatched Within 5 Working Days

Quantitative Core Level Photoelectron Spectroscopy

Juan A Colón Santana

This book introduces the reader to the concepts and instrumentation that emerge in an experimental approach to the photoemission process. The basic elements implemented for the technique are discussed and the geometry of the instrumentation is explained. This book covers each of the features that have been observed in the X-ray photoemission spectra and provides the tools necessary for their understanding and correct identification. Charging effects are covered in the penultimate chapter with the final chapter bringing closure to the basic uses of the X-ray photoemission process, as well as guiding the reader through some of the most popular applications used in current research.

  • Imprint: IOP Concise Physics
  • Format: Hardback
  • ISBN: 9781643278759
  • Publication Date: Jan 2016
  • Availability: In Stock - Despatched Within 5 Working Days

Introduction to Focused Ion Beam Nanometrology

David C. Cox

This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

  • Imprint: IOP Concise Physics
  • Format: Paperback
  • ISBN: 9781681740201
  • Publication Date: Oct 2015
  • Availability: In Stock - Despatched Within 5 Working Days

An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science

Sarah Fearn

  • Imprint: IOP Concise Physics
  • Format: Paperback
  • ISBN: 9781681740249
  • Publication Date: Oct 2015
  • Availability: In Stock - Despatched Within 5 Working Days